Invention Grant
- Patent Title: Method for detecting foreign material, and apparatus and system therefor
-
Application No.: US16327622Application Date: 2017-08-23
-
Publication No.: US11005303B2Publication Date: 2021-05-11
- Inventor: Jae Hee Park
- Applicant: LG INNOTEK CO., LTD.
- Applicant Address: KR Seoul
- Assignee: LG INNOTEK CO., LTD.
- Current Assignee: LG INNOTEK CO., LTD.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: KR10-2016-0106789 20160823,KR10-2016-0117518 20160912
- International Application: PCT/KR2017/009208 WO 20170823
- International Announcement: WO2018/038531 WO 20180301
- Main IPC: H02J50/60
- IPC: H02J50/60 ; H02J50/10 ; H02J50/20 ; H02J7/02 ; H02J50/90 ; H02J50/40 ; H02J50/80

Abstract:
The present invention relates to a method for detecting foreign material, and an apparatus and a system therefor, and a method for detecting foreign material in a wireless power transmitter, according to one embodiment of the present invention, comprises the steps of: measuring a quality factor value, which corresponds to a reference operation frequency, when an object is sensed; searching for a current peak frequency having a maximum quality factor value within an operation frequency band; receiving, form a wireless power receiver, a foreign material detection state packet including information on a reference peak frequency; correcting the measured quality factor value by using a difference value between the current peak frequency and the reference peak frequency; and determining whether the foreign material exists by comparing the corrected quality factor value with a predetermined quality factor threshold value. Therefore, the present invention has an advantage of enabling foreign material to be more effectively and accurately detected.
Public/Granted literature
- US20190190320A1 METHOD FOR DETECTING FOREIGN MATERIAL, AND APPARATUS AND SYSTEM THEREFOR Public/Granted day:2019-06-20
Information query