Invention Grant
- Patent Title: Probe card device and three-dimensional signal transfer structure thereof
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Application No.: US16382301Application Date: 2019-04-12
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Publication No.: US11009526B2Publication Date: 2021-05-18
- Inventor: Wen-Tsung Lee , Kai-Chieh Hsieh , Wei-Jhih Su
- Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Applicant Address: TW Taoyuan
- Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Current Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Current Assignee Address: TW Taoyuan
- Agency: Li & Cai Intellectual Property (USA) Office
- Priority: TW107119477 20180606
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/073 ; G01R1/067

Abstract:
A three-dimensional (3D) signal transfer structure of a probe card device includes a transfer plate, a supporting frame, and a guiding plate. The transfer plate has a first surface and a second surface that is opposite to the first surface. The transfer plate includes a plurality of signal circuits each having a signal contact arranged on the first surface. The supporting frame is abutted against and fixed onto the first surface of the transfer plate. A portion of the first surface abutted against the supporting frame is arranged outside the signal contacts. The guiding plate has a plurality of thru-holes and is disposed on the supporting frame. The guiding plate, the supporting frame, and the transfer plate jointly and surroundingly define a receiving space, and the signal contacts of the transfer plate are arranged in the receiving space.
Information query