Invention Grant
- Patent Title: Abnormality determination apparatus, abnormality determination method, and computer readable medium
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Application No.: US16605694Application Date: 2018-05-09
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Publication No.: US11010229B2Publication Date: 2021-05-18
- Inventor: Yasuhiro Omori , Hiroaki Ishikawa
- Applicant: MITSUBISHI ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP.
- Priority: WOPCT/JP2017/019842 20170529
- International Application: PCT/JP2018/017855 WO 20180509
- International Announcement: WO2018/221136 WO 20181206
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G07C5/08 ; G06F11/16 ; B60W50/023

Abstract:
A failure diagnostic unit (144) obtains a control value for controlling an actuator (20) from each of a first processing circuit (11) and a second processing circuit (12) that are duplicated processing circuits. In a case where a first control value that has been obtained from the first processing circuit (11) does not match a second control value that has been obtained from the second processing circuit (12), the failure diagnostic unit (144) compares a state normal range with at least either the first control value or the second control value, and determines which of the first processing circuit (11) and the second processing circuit (12) an abnormality has occurred in, the state normal range being a range of a normal value of the control value that is estimated from a current operation state of a higher-order system that includes the actuator (20).
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