A method for compensating for characteristics of a transistor. In some embodiments, the method includes: measuring an error value, the error value being a difference between: a target current and a current driven by the transistor when the transistor is controlled by a compensated control signal based on an input control signal; adding to a first compensation parameter a first adjustment; adding to a second compensation parameter a second adjustment; and applying to a gate of the transistor a voltage equal to the sum of: the second compensation parameter, and the product of: the first compensation parameter, and an uncompensated drive voltage.