Invention Grant
- Patent Title: One-time programmable memory using gate-all-around structures
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Application No.: US16799809Application Date: 2020-02-24
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Publication No.: US11011577B2Publication Date: 2021-05-18
- Inventor: Shine C. Chung
- Applicant: Attopsemi Technology, Co., LTD
- Applicant Address: TW Hsinchu
- Assignee: Attopsemi Technology, Co., LTD
- Current Assignee: Attopsemi Technology, Co., LTD
- Current Assignee Address: TW Hsinchu
- Main IPC: G11C17/16
- IPC: G11C17/16 ; G11C17/18 ; G11C13/00 ; G11C11/16 ; H01L27/24 ; H01L27/22 ; H01L45/00 ; H01L27/12 ; H01L27/092

Abstract:
An One-Time Programmable (OTP) memory is built in at least one of nano-wire structures. The OTP memory has a plurality of OTP cells. At least one of the OTP cells can have at least one resistive element and at least one nano-wires. The at least one resistive element can be built by an extended source/drain or a MOS gate. The at least one nano-wires can be built on an isolated structure that has at least one MOS gate dividing nano-wires into at least one first active region and a second active region. The first active region can be doped with a first type of dopant and the second active region can be doped with a first or second type of dopant. The OTP element can be coupled to the first active region with the other end coupled to a first supply voltage line. The second active region can be coupled to a second voltage supply line and the MOS gate is coupled to a third voltage supply line. A plurality of address lines can be decoded into a plurality of wordlines coupled to the second or third voltage supply lines. Another plurality of address lines can be decoded into a plurality of bitlines coupled to the first supply voltage lines. By selecting the proper address lines, a target OTP cell can be selected for programming into another logic state or for reading of its logic state.
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