Invention Grant
- Patent Title: Image inspection system and image inspection method
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Application No.: US16797135Application Date: 2020-02-21
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Publication No.: US11012612B2Publication Date: 2021-05-18
- Inventor: Tsuyoshi Yamagami
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JPJP2019-072974 20190405
- Main IPC: H04N5/232
- IPC: H04N5/232 ; G06T7/586

Abstract:
Accuracy of image inspection is improved by causing an imaging device conformable to a standardization standard to combine a plurality of captured images. A setting device transmits a setting content for realizing a combination setting set by a user on a user interface and register information indicating a location where the setting content is stored, to the imaging device. The imaging device stores the setting content in the location indicated by the corresponding register information, and executes the combination processing for combining the plurality of captured images.
Public/Granted literature
- US20200322525A1 Image Inspection System And Image Inspection Method Public/Granted day:2020-10-08
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