Invention Grant
- Patent Title: Evoked potential measuring apparatus
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Application No.: US15436910Application Date: 2017-02-20
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Publication No.: US11020039B2Publication Date: 2021-06-01
- Inventor: Akira Hyodo
- Applicant: NIHON KOHDEN CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIHON KOHDEN CORPORATION
- Current Assignee: NIHON KOHDEN CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JPJP2016-035795 20160226
- Main IPC: A61B5/0484
- IPC: A61B5/0484 ; A61B5/04 ; A61B5/0402 ; A61B5/00 ; A61B5/377 ; A61B5/316 ; A61B5/318

Abstract:
An evoked potential measuring apparatus includes: an evoked potential acquiring section which is configured to acquire a plurality of evoked potential waveforms from a subject in response to stimulation; an average processing section which is configured to arithmetically average the plurality of evoked potential waveforms to acquire an average waveform; a first statistical value calculator which, each time a waveform set including an N (N is 2 or more) number of evoked potential waveforms is acquired, is configured to calculate a first statistical value of the waveform set; and an updation processing section which is configured to update the average waveform to eliminate a waveform set in which the first statistical value exceeds a first threshold, from the arithmetic average.
Public/Granted literature
- US20170245775A1 EVOKED POTENTIAL MEASURING APPARATUS Public/Granted day:2017-08-31
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