Invention Grant
- Patent Title: Mode-dependent loss measurement method and measurement device
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Application No.: US15923062Application Date: 2018-03-16
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Publication No.: US11022523B2Publication Date: 2021-06-01
- Inventor: Tetsuya Hayashi
- Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Applicant Address: JP Osaka
- Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Current Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Current Assignee Address: JP Osaka
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JPJP2016-042209 20160304
- Main IPC: G01M11/00
- IPC: G01M11/00 ; G02B6/02 ; G02B6/28 ; G02B6/42

Abstract:
A present embodiment relates to a MDL measurement method and the like including a structure for enabling MDL measurement without increasing a processing load. The present embodiment sequentially executes, for N (≥2) spatial modes, light-input operation of inputting light of a predetermined intensity to an arbitrary spatial mode, and intensity measurement operation of measuring an output light intensity of each of the N spatial modes including the arbitrary spatial mode, to generate a transfer matrix relating to transmission loss in an optical fiber as a measurement target, and determine at least a linear value of MDL per unit fiber length by using each component value of the generated transfer matrix.
Public/Granted literature
- US20180202895A1 MODE-DEPENDENT LOSS MEASUREMENT METHOD AND MEASUREMENT DEVICE Public/Granted day:2018-07-19
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