Invention Grant
- Patent Title: Image inspection device
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Application No.: US16219968Application Date: 2018-12-14
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Publication No.: US11022560B2Publication Date: 2021-06-01
- Inventor: Yutaka Kato
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-041889 20180308
- Main IPC: G01N21/88
- IPC: G01N21/88 ; H04N5/225 ; H04N5/247 ; H04N5/232 ; G03B15/03 ; H04N5/235 ; G03B37/04 ; G03B21/00 ; H04N7/18

Abstract:
An image inspection device which can image an object with a plurality of cameras in a state in which the object is optimally illuminated and which can also be downsized is provided. The image inspection device includes a plurality of imaging parts that image the object, an illumination part that is disposed between the object and the plurality of imaging parts and radiates light toward the object and has a light-transmissive property, and a control part that controls the plurality of imaging parts and the illumination part. The illumination part includes a plurality of illumination elements which are arranged in a matrix and are allowed to be turned on independently. The control part controls the plurality of illumination elements to cause the illumination part to illuminate a region of the object corresponding to a field of view of the plurality of imaging parts.
Public/Granted literature
- US20190277771A1 IMAGE INSPECTION DEVICE Public/Granted day:2019-09-12
Information query