Invention Grant
- Patent Title: Parallel plate capacitor system for determining impedance characteristics of material under test (MUT)
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Application No.: US16640157Application Date: 2019-04-23
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Publication No.: US11022594B2Publication Date: 2021-06-01
- Inventor: Manfred Geier , Adam D. Blot , Andrew J. Westcott
- Applicant: TransTech Systems, Inc.
- Applicant Address: US NY Latham
- Assignee: TransTech Systems, Inc.
- Current Assignee: TransTech Systems, Inc.
- Current Assignee Address: US NY Latham
- Agency: Hoffman Warnick LLC
- International Application: PCT/US2019/028678 WO 20190423
- International Announcement: WO2019/209802 WO 20191031
- Main IPC: G01R27/00
- IPC: G01R27/00 ; G01N33/24 ; G01N33/38 ; G01N27/22 ; A61B5/0536 ; G01R27/02 ; G01R31/50 ; G01R35/00 ; G01R19/00 ; G01R27/32 ; G01R31/34

Abstract:
Various aspects of the disclosure relate to evaluating the electromagnetic impedance characteristics of a material under test (MUT) over a range of frequencies. In particular aspects, a system includes: an electrically non-conducting container sized to hold the MUT, the electrically non-conducting container having a first opening at a first end thereof and a second opening at a second, opposite end thereof; a transmitting electrode assembly at the first end of the electrically non-conducting container, the transmitting electrode assembly having a transmitting electrode with a transmitting surface; and a receiving electrode assembly at the second end of the electrically non-conducting container, the receiving electrode assembly having a receiving electrode with a receiving surface, wherein the receiving electrode is approximately parallel with the transmitting electrode, and wherein the transmitting surface of the transmitting electrode is larger than the receiving surface of the receiving electrode.
Public/Granted literature
- US20210055280A1 PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTERISTICS OF MATERIAL UNDER TEST (MUT) Public/Granted day:2021-02-25
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