Invention Grant
- Patent Title: Handling device for handling a measuring probe
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Application No.: US16646844Application Date: 2018-09-13
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Publication No.: US11022786B2Publication Date: 2021-06-01
- Inventor: Norbert Pinno-Rath , Gernot Leuprecht , Daniel Koller
- Applicant: Anton Paar GmbH
- Applicant Address: AT Graz
- Assignee: Anton Paar GmbH
- Current Assignee: Anton Paar GmbH
- Current Assignee Address: AT Graz
- Agency: Smith Tempel Blaha LLC
- Agent Robert A. Blaha
- Priority: ATA50765/2017 20170913
- International Application: PCT/EP2018/074795 WO 20180913
- International Announcement: WO2019/053153 WO 20190321
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G01Q60/16 ; G01Q60/38 ; G01Q70/02

Abstract:
A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.
Public/Granted literature
- US20200326518A1 Handling Device for Handling a Measuring Probe Public/Granted day:2020-10-15
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