Disclosed are methods, systems, and articles of manufacture for characterizing an electronic design with a susceptibility window. These techniques identify a set of multiple aggressors in an electronic design and determine, at a susceptibility window module stored in memory and executing in conjunction with a microprocessor of a computing node, a susceptibility window for an internal node of a victim and a timing window for the set of multiple aggressors in the electronic design. These techniques further determine a subset having at least one aggressor using at least the susceptibility window of the victim and the timing window for the set of multiple aggressors, and determine whether a glitch in the electronic design causes a violation at the internal node of the electronic design based at least in part upon the timing window and the susceptibility.