Invention Grant
- Patent Title: Nanosheet FET bottom isolation
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Application No.: US16687734Application Date: 2019-11-19
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Publication No.: US11024711B2Publication Date: 2021-06-01
- Inventor: Ruqiang Bao , Zhenxing Bi , Kangguo Cheng , Zheng Xu
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Randall Bluestone
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/08 ; H01L21/762 ; H01L21/02

Abstract:
A technique relates to a semiconductor device. A rare earth material is formed on a substrate. An isolation layer is formed at an interface of the rare earth material and the substrate. Channel layers are formed over the isolation layer. Source or drain (S/D) regions are formed on the isolation layer.
Information query
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