Invention Grant
- Patent Title: Abnormality detector
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Application No.: US16607513Application Date: 2018-02-21
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Publication No.: US11029201B2Publication Date: 2021-06-08
- Inventor: Ryo Ishikawa , Takeshi Takashima , Kenji Kido , Masanori Hirasawa , Yuichiro Hanai
- Applicant: Fukada Kogyo Co., Ltd.
- Applicant Address: JP Nagoya
- Assignee: Fukada Kogyo Co., Ltd.
- Current Assignee: Fukada Kogyo Co., Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JPJP2017-088953 20170427,JPJP2017-088954 20170427
- International Application: PCT/JP2018/006298 WO 20180221
- International Announcement: WO2018/198504 WO 20181101
- Main IPC: G01J1/42
- IPC: G01J1/42 ; G01J1/04 ; G01J5/00 ; G01J5/60 ; G08B17/12
Abstract:
The disclosure provides respective detection devices of a sensor array that detect infrared light and convert the infrared light into a DC component electrical signal.
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