• Patent Title: Method and device for analysing an electromagnetic wave in high definition
  • Application No.: US16334906
    Application Date: 2017-09-28
  • Publication No.: US11029214B2
    Publication Date: 2021-06-08
  • Inventor: Benoît WattellierAnaïs Saintoyant
  • Applicant: PHASICS
  • Applicant Address: FR Soisy sur Seine
  • Assignee: PHASICS
  • Current Assignee: PHASICS
  • Current Assignee Address: FR Soisy sur Seine
  • Agency: Anglehart et al.
  • Priority: FR1659411 20160930
  • International Application: PCT/EP2017/074674 WO 20170928
  • International Announcement: WO2018/060359 WO 20180405
  • Main IPC: G01J9/02
  • IPC: G01J9/02 G02B5/18 G01J9/00
Method and device for analysing an electromagnetic wave in high definition
Abstract:
The present invention relates to a method comprising reception of an incident electromagnetic wave (9) by a diffractive element (2) and conversion of this incident electromagnetic wave (9) into a diffracted electromagnetic wave (10) by the diffractive element (2); reception of the diffracted electromagnetic wave (10) by a matrix-array sensor (4) comprising a matrix-array of pixels that are aligned along one or two axes of pixel alignment (13, 14). The method comprises a plurality of acquisitions, by the matrix-array sensor (4), of a signal of the diffracted electromagnetic wave (10) corresponding to a plurality of relative positions between the diffractive element (2) and the matrix-array sensor (4). The invention also relates to a device (1) implementing this method.
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