Invention Grant
- Patent Title: Method and device for analysing an electromagnetic wave in high definition
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Application No.: US16334906Application Date: 2017-09-28
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Publication No.: US11029214B2Publication Date: 2021-06-08
- Inventor: Benoît Wattellier , Anaïs Saintoyant
- Applicant: PHASICS
- Applicant Address: FR Soisy sur Seine
- Assignee: PHASICS
- Current Assignee: PHASICS
- Current Assignee Address: FR Soisy sur Seine
- Agency: Anglehart et al.
- Priority: FR1659411 20160930
- International Application: PCT/EP2017/074674 WO 20170928
- International Announcement: WO2018/060359 WO 20180405
- Main IPC: G01J9/02
- IPC: G01J9/02 ; G02B5/18 ; G01J9/00

Abstract:
The present invention relates to a method comprising reception of an incident electromagnetic wave (9) by a diffractive element (2) and conversion of this incident electromagnetic wave (9) into a diffracted electromagnetic wave (10) by the diffractive element (2); reception of the diffracted electromagnetic wave (10) by a matrix-array sensor (4) comprising a matrix-array of pixels that are aligned along one or two axes of pixel alignment (13, 14). The method comprises a plurality of acquisitions, by the matrix-array sensor (4), of a signal of the diffracted electromagnetic wave (10) corresponding to a plurality of relative positions between the diffractive element (2) and the matrix-array sensor (4). The invention also relates to a device (1) implementing this method.
Public/Granted literature
- US20190285481A1 METHOD AND DEVICE FOR ANALYSING AN ELECTROMAGNETIC WAVE IN HIGH DEFINITION Public/Granted day:2019-09-19
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