• Patent Title: Assessing device, assessing system, assessing method, and computer-readable recording medium
  • Application No.: US16341488
    Application Date: 2017-10-20
  • Publication No.: US11029231B2
    Publication Date: 2021-06-08
  • Inventor: Shohei KinoshitaShigeru Kasai
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JPJP2016-208663 20161025
  • International Application: PCT/JP2017/038020 WO 20171020
  • International Announcement: WO2018/079438 WO 20180503
  • Main IPC: G01M7/02
  • IPC: G01M7/02 G01N29/07
Assessing device, assessing system, assessing method, and computer-readable recording medium
Abstract:
An assessing device capable of assessing presence or absence of local damage in a structure is provided. The assessing device includes a dominant frequency identifying unit that identifies a dominant frequency of a vibration at each of a plurality of spots in a structure, based on information indicating the vibration at each of the plurality of spots, a phase difference identifying unit that identifies a phase difference at the dominant frequency between the vibrations at the plurality of spots, based on the dominant frequency and information indicating the vibrations; and an assessing unit that assesses damage in the structure, based on the phase difference.
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