Invention Grant
- Patent Title: Optical time domain reflectometer and testing method of optical time domain reflectometer
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Application No.: US16747888Application Date: 2020-01-21
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Publication No.: US11029232B2Publication Date: 2021-06-08
- Inventor: Taichi Murakami
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: JPJP2019-010799 20190125
- Main IPC: G01M11/00
- IPC: G01M11/00

Abstract:
An optical time domain reflectometer includes: a storage unit that stores in advance a fourth backscattered light level PZ(W2) obtained by adding a difference ΔPR between a second backscattered light level PR(W1) which is measured using a first pulse width W1 and a third backscattered light level PR(W2) which is measured using a second pulse width W2 to a first backscattered light level PZ(W1) at a connection point DD to a measurement target optical fiber which is measured using the first pulse width so as to be associated with the second pulse width; and an arithmetic processing unit that reads the fourth backscattered light level PZ(W2) at the second pulse width corresponding to a pulse width of an optical pulse output from a light source to the measurement target optical fiber from the storage unit and calculates a transmission loss LT in the measurement target optical fiber.
Public/Granted literature
- US20200240872A1 OPTICAL TIME DOMAIN REFLECTOMETER AND TESTING METHOD OF OPTICAL TIME DOMAIN REFLECTOMETER Public/Granted day:2020-07-30
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