Invention Grant
- Patent Title: X-ray detectors of high spatial resolution
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Application No.: US15737797Application Date: 2015-10-14
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Publication No.: US11029424B2Publication Date: 2021-06-08
- Inventor: Peiyan Cao , Yurun Liu
- Applicant: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: IPro, PLLC
- International Application: PCT/CN2015/091927 WO 20151014
- International Announcement: WO2017/063156 WO 20170420
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01T1/24 ; H01L27/146 ; A61B6/00 ; G01N23/046 ; G01V5/00 ; H01J37/244

Abstract:
An apparatus, system and method suitable for detecting X-ray are disclosed. In one example, the apparatus comprises: an X-ray absorption layer and a mask; wherein the mask comprises a first window and a second window, and a portion between the first window and the second window; wherein the first and second windows are not opaque to an incident X-ray; wherein the portion is opaque to the incident X-ray; and wherein the first and second windows are arranged such that charge carriers generated in the X-ray absorption layer by an X-ray photon propagating through the first window and charge carriers generated in the X-ray absorption layer by an X-ray photon propagating through the second window do not spatially overlap.
Public/Granted literature
- US20190004193A1 X-Ray Detectors of High Spatial Resolution Public/Granted day:2019-01-03
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