• Patent Title: Gas analyzing device and gas analyzing method
  • Application No.: US16465751
    Application Date: 2017-08-14
  • Publication No.: US11035756B2
    Publication Date: 2021-06-15
  • Inventor: Tomoshi Yoshimura
  • Applicant: HORIBA, LTD.
  • Applicant Address: JP Kyoto
  • Assignee: HORIBA, LTD.
  • Current Assignee: HORIBA, LTD.
  • Current Assignee Address: JP Kyoto
  • Agency: Brooks Kushman P.C.
  • Priority: JPJP2016-238143 20161208
  • International Application: PCT/JP2017/029279 WO 20170814
  • International Announcement: WO2018/105169 WO 20180614
  • Main IPC: G01M15/10
  • IPC: G01M15/10
Gas analyzing device and gas analyzing method
Abstract:
In order to secure a separation ability required for an oxidation catalyst such as a non-methane cutter, and to enable a sample gas to be measured accurately, this gas analyzing device is provided with a sample gas line where a sample gas flows, an analyzer that is provided in the sample gas line and that detects the concentration of a specific component contained in the sample gas, a catalyst that is arranged upstream of the analyzer in the sample gas line and that reacts with the sample gas, and a moisture concentration adjusting unit that is arranged upstream of the catalyst in the sample gas line to adjust the moisture concentration of the sample gas.
Public/Granted literature
Information query
Patent Agency Ranking
0/0