Invention Grant
- Patent Title: Gas analyzing device and gas analyzing method
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Application No.: US16465751Application Date: 2017-08-14
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Publication No.: US11035756B2Publication Date: 2021-06-15
- Inventor: Tomoshi Yoshimura
- Applicant: HORIBA, LTD.
- Applicant Address: JP Kyoto
- Assignee: HORIBA, LTD.
- Current Assignee: HORIBA, LTD.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JPJP2016-238143 20161208
- International Application: PCT/JP2017/029279 WO 20170814
- International Announcement: WO2018/105169 WO 20180614
- Main IPC: G01M15/10
- IPC: G01M15/10

Abstract:
In order to secure a separation ability required for an oxidation catalyst such as a non-methane cutter, and to enable a sample gas to be measured accurately, this gas analyzing device is provided with a sample gas line where a sample gas flows, an analyzer that is provided in the sample gas line and that detects the concentration of a specific component contained in the sample gas, a catalyst that is arranged upstream of the analyzer in the sample gas line and that reacts with the sample gas, and a moisture concentration adjusting unit that is arranged upstream of the catalyst in the sample gas line to adjust the moisture concentration of the sample gas.
Public/Granted literature
- US20190391045A1 GAS ANALYZING DEVICE AND GAS ANALYZING METHOD Public/Granted day:2019-12-26
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