Invention Grant
- Patent Title: System and method for x-ray imaging and classification of volume defects
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Application No.: US15636614Application Date: 2017-06-28
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Publication No.: US11035804B2Publication Date: 2021-06-15
- Inventor: Richard W. Solarz , Oleg Khodykin , Bosheng Zhang , Steven R. Lange
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G01N21/956
- IPC: G01N21/956 ; G01N21/47 ; G01N23/207 ; G01N23/04 ; G06T7/00 ; H01L21/66 ; G01N21/95

Abstract:
X-ray imaging and classification of volume defects within a three-dimensional structure includes identifying one or more volume defects within a three-dimensional structure of a sample and acquiring, with a transmission-mode x-ray diffraction imaging tool, one or more coherent diffraction images of the one or more identified volume defects. The process includes classifying the one or more volume defects within a volume of the three-dimensional structure based on the one or more coherent diffraction images, and training an additional optical or electron-based inspection tool based on the one or more classified defects.
Public/Granted literature
- US20190003988A1 System and Method for X-Ray Imaging and Classification of Volume Defects Public/Granted day:2019-01-03
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