Invention Grant
- Patent Title: Object determination device, program, object determination method, and semiconductor device
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Application No.: US16386981Application Date: 2019-04-17
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Publication No.: US11035811B2Publication Date: 2021-06-15
- Inventor: Hiroji Akahori
- Applicant: LAPIS Semiconductor Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Rabin & Berdo, P.C.
- Priority: JPJP2018-087572 20180427
- Main IPC: G01N27/02
- IPC: G01N27/02 ; G01V3/02

Abstract:
An object-characteristic determination device includes a calculation unit and a determination unit. The calculation unit calculates a first feature value and a second feature value differing from the first feature value according to a first signal at a first frequency and a second signal at a second frequency. The first signal and the second signal are received by a reception unit after passing through the object. The first feature value and the second feature value represent features of the first signal and the second signal. The determination unit determines a property of the object on the basis of a difference in the first feature values of the first signal and a difference in the second feature values of the second signal, a relationship between a plurality of properties of the object, and a plurality of differences in the first feature values and a plurality of differences in the second feature values.
Public/Granted literature
- US20190331621A1 OBJECT DETERMINATION DEVICE, PROGRAM, OBJECT DETERMINATION METHOD, AND SEMICONDUCTOR DEVICE Public/Granted day:2019-10-31
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