Invention Grant
- Patent Title: Method for analyzing the performance of multiple test instruments measuring the same type of part
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Application No.: US15798345Application Date: 2017-10-30
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Publication No.: US11036470B2Publication Date: 2021-06-15
- Inventor: Jonathan Helfman
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US MN Minneapolis
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US MN Minneapolis
- Main IPC: G06F16/23
- IPC: G06F16/23 ; G06F7/08

Abstract:
A method for operating a data processing system to analyze data sets for groupings and a computer readable medium having instructions to execute that method are disclosed. The method includes causing the data processing system to receive a plurality of data sets, each data set including a plurality of values characterized by a statistical distribution and a label. The method also includes causing the data processing system to compute a plurality of statistical parameters for each of the plurality of data sets, to generate a data set vector having components equal to the plurality of statistical parameters for each of the plurality of data sets, to assign each data set to a cluster based on the data set vectors using a clustering algorithm, and to generate a display of the statistical distributions as a function of the labels in which the statistical distributions belonging to the same cluster are grouped together.
Public/Granted literature
- US20190129691A1 Method for Analyzing the Performance of Multiple Test Instruments Measuring the Same Type of Part Public/Granted day:2019-05-02
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