Invention Grant
- Patent Title: Diagnostic test planning using machine learning techniques
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Application No.: US15134543Application Date: 2016-04-21
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Publication No.: US11037070B2Publication Date: 2021-06-15
- Inventor: Marcos Salganicoff , Xiang Sean Zhou , Gerardo Hermosillo Valadez , Luca Bogoni
- Applicant: Siemens Healthcare GmbH
- Applicant Address: DE Erlangen
- Assignee: Siemens Healthcare GmbH
- Current Assignee: Siemens Healthcare GmbH
- Current Assignee Address: DE Erlangen
- Main IPC: G06N20/00
- IPC: G06N20/00 ; G06N5/00 ; G16H50/20

Abstract:
A framework diagnostic test planning is described herein. In accordance with one aspect, the framework receives data representing one or more sample patients, diagnostic tests administered to the one or more sample patients, diagnostic test results and confirmed medical conditions associated with the administered diagnostic tests. The framework trains one or more classifiers based on the data to identify diagnostic test plans from the diagnostic tests. The one or more classifiers may then be applied to current patient data to generate a diagnostic test plan for a given patient.
Public/Granted literature
- US20160321414A1 Diagnostic Test Planning Public/Granted day:2016-11-03
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