Invention Grant
- Patent Title: Variable resistance memory device
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Application No.: US16392099Application Date: 2019-04-23
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Publication No.: US11037991B2Publication Date: 2021-06-15
- Inventor: Yoongoo Kang , Changwoo Seo , Dain Lee , Wook-Yeol Yi , Hoi Sung Chung
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2018-0117632 20181002
- Main IPC: H01L45/02
- IPC: H01L45/02 ; H01L27/24 ; H01L45/00

Abstract:
A variable resistance memory device includes memory cells arranged on a substrate and an insulating structure between the memory cells. Each of the memory cells includes a variable resistance pattern and a switching pattern vertically stacked on the substrate. The insulating structure includes a first insulating pattern between the memory cells, and a second insulating pattern between the first insulating pattern and each of the memory cells. The first insulating pattern includes a material different from a material of the second insulating pattern.
Information query
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