Invention Grant
- Patent Title: Capacitor structure and method of making the same
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Application No.: US14609159Application Date: 2015-01-29
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Publication No.: US11038010B2Publication Date: 2021-06-15
- Inventor: Jian-Shiou Huang , Chia-Shiung Tsai , Cheng-Yuan Tsai , Hsing-Lien Lin , Yao-Wen Chang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Cooper Legal Group, LLC
- Main IPC: H01L49/02
- IPC: H01L49/02 ; H01L21/02

Abstract:
A structure includes a semiconductor substrate, a conductor-insulator-conductor capacitor. The conductor-insulator-conductor capacitor is disposed on the semiconductor substrate and includes a first conductor, a nitrogenous dielectric layer and a second conductor. The nitrogenous dielectric layer is disposed on the first conductor and the second conductor is disposed on the nitrogenous dielectric layer.
Public/Granted literature
- US20160225844A1 CAPACITOR STRUCTURE AND METHOD OF MAKING THE SAME Public/Granted day:2016-08-04
Information query
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