Invention Grant
- Patent Title: Film forming method for SiC film
-
Application No.: US16467746Application Date: 2017-11-16
-
Publication No.: US11041239B2Publication Date: 2021-06-22
- Inventor: Taiki Katou , Shuji Azumo , Yusaku Kashiwagi
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JPJP2016-239716 20161209
- International Application: PCT/JP2017/041237 WO 20171116
- International Announcement: WO2018/105349 WO 20180614
- Main IPC: C23C16/455
- IPC: C23C16/455 ; C23C16/32 ; H01L21/02 ; C23C16/458

Abstract:
A method for forming a SiC film on a target substrate by ALD, comprises: activating a surface of the target substrate by activation gas plasma which is plasmatized an activation gas; and forming a SiC film by supplying a source gas containing a precursor represented by a chemical formula RSiX13 or RSiHClX2 onto the target substrate whose the surface is activated by activating the surface of the target substrate, where, R is an organic group having an unsaturated bond, X1 is selected from a group consisting of H, F, Cl, Br and I, and X2 is one selected from a group consisting of Cl, Br and I.
Public/Granted literature
- US20200063262A1 FILM FORMING METHOD FOR SiC FILM Public/Granted day:2020-02-27
Information query
IPC分类: