Invention Grant
- Patent Title: Differential refractometer
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Application No.: US16650529Application Date: 2018-07-12
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Publication No.: US11041804B2Publication Date: 2021-06-22
- Inventor: Ryutaro Oda
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- Priority: JPJP2017-194582 20171004
- International Application: PCT/JP2018/026272 WO 20180712
- International Announcement: WO2019/069527 WO 20190411
- Main IPC: G01N21/41
- IPC: G01N21/41

Abstract:
A plurality of light-receiving elements that are arranged in two rows are provided on a light-receiving surface of a detector. A slit image formed on this detector. One group of a plurality of the light-receiving elements are arranged consecutively in a displacement direction of the slit image to form a row (one light-receiving elements row), and another group of a plurality of the light-receiving elements are also arranged consecutively in the displacement direction of the slit image to form a row (another light-receiving elements row). The one light-receiving elements row and the other light-receiving elements row are in contact with each other.
Public/Granted literature
- US20200278291A1 DIFFERENTIAL REFRACTOMETER Public/Granted day:2020-09-03
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