Invention Grant
- Patent Title: Microwave-based measuring device
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Application No.: US16904234Application Date: 2020-06-17
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Publication No.: US11041817B2Publication Date: 2021-06-22
- Inventor: Joerg Baeuerle , Rachid El Korch , Steffen Mueller
- Applicant: BERTHOLD TECHNOLOGIES GmbH & Co. KG
- Applicant Address: DE Bad Wildbad
- Assignee: BERTHOLD TECHNOLOGIES GmbH & Co. KG
- Current Assignee: BERTHOLD TECHNOLOGIES GmbH & Co. KG
- Current Assignee Address: DE Bad Wildbad
- Agency: Crowell & Moring LLP
- Priority: DE102019210303.0 20190711
- Main IPC: G01N22/04
- IPC: G01N22/04

Abstract:
A microwave-based measuring device includes a number n of sensors, each sensor of the number n of sensors being embodied to generate associated sensor data such that, overall, a number n of items of sensor data are generated by way of the number n of sensors. A measurement variable calculation unit is embodied to calculate a number m of measurement variable values depending on the number n of items of sensor data on the basis of values of a number d of parameters. A learning unit is embodied to calculate the values of the number d of parameters on the basis of training data.
Public/Granted literature
- US20210010952A1 Microwave-Based Measuring Device Public/Granted day:2021-01-14
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