Invention Grant
- Patent Title: Measurement device and measurement method
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Application No.: US16421193Application Date: 2019-05-23
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Publication No.: US11041824B2Publication Date: 2021-06-22
- Inventor: Kenichiro Kusano , Atsuhiko Okada , Hiroaki Sano , Masao Okihara
- Applicant: LAPIS SEMICONDUCTOR CO., LTD.
- Applicant Address: JP Kanagawa
- Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee: LAPIS SEMICONDUCTOR CO., LTD.
- Current Assignee Address: JP Kanagawa
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: JPJP2018-099729 20180524
- Main IPC: G01N27/414
- IPC: G01N27/414

Abstract:
A measurement device including: an ion-sensitive element; a reference electrode disposed in a state in which a measurement subject is interposed between the reference electrode and the ion-sensitive element; and a controller configured to: establish a first state at a predetermined interval, the first state being a state in which a current flows at the ion-sensitive element, and establish a second state within each period after the first state has been established and before the first state is next established, the second state being a state in which a potential difference between the ion-sensitive element and the reference electrode is greater than a potential difference between the ion-sensitive element and the reference electrode in the first state.
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