Invention Grant
- Patent Title: Test element analysis system for the analytical examination of a sample
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Application No.: US16106889Application Date: 2018-08-21
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Publication No.: US11041846B2Publication Date: 2021-06-22
- Inventor: Kai Hebestreit , Sylvia Saecker , Klaus Thome , Andreas Weller , Robert Knapstein , Werner Heidt , Stefan Lieder
- Applicant: Roche Diagnostics Operations, Inc.
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Roche Diagnostics Operations, Inc.
- Priority: EPEP16159147 20160308
- Main IPC: G01N25/00
- IPC: G01N25/00 ; G01K1/00 ; G01K7/00 ; G01N33/487 ; G01N27/327 ; A61B5/145 ; G01N33/49

Abstract:
A test element analysis system for the analytical examination of a sample is disclosed. The test element analysis system comprises: at least one evaluation device with at least one test element holder for positioning a test element containing the sample and at least one measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for the analyte; at least one electrical heating element configured for electrically heating the test element; at least one electrical power supply for supplying electrical energy to the electrical heating element; at least one temperature sensor connected to the test element holder for detecting a temperature of the test element holder; at least one gap detection device configured for monitoring the electrical energy Espez supplied by the electrical power supply to the electrical heating element for reaching a predetermined target temperature measured by the temperature sensor.
Public/Granted literature
- US20180356391A1 TEST ELEMENT ANALYSIS SYSTEM FOR THE ANALYTICAL EXAMINATION OF A SAMPLE Public/Granted day:2018-12-13
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