Invention Grant
- Patent Title: Contactless coupling between test and measurement system and a device under test
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Application No.: US16162354Application Date: 2018-10-16
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Publication No.: US11041880B2Publication Date: 2021-06-22
- Inventor: Josiah A. Bartlett
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash Graham & Dunn
- Agent Andrew J. Harrington
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R31/303 ; G01R1/07 ; G01R1/067 ; G01R1/073 ; G01R27/32 ; G01R31/28

Abstract:
A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
Public/Granted literature
- US20190170790A1 Test and Measurement Probe Coupler Public/Granted day:2019-06-06
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