In some aspects, the present disclosure provides a method for testing an integrated circuit (IC). In some configurations, the method includes determining, by a test controller embedded in the IC, a change in operation of the IC from a normal mode to a test mode. The method also includes communicating, by the test controller to a chain of data storage elements in the IC: a first test signal configured to change an input/output (I/O) function of a first IC pin, and a second test signal configured to apply one of a plurality of test functions to each data storage element in the chain of data storage elements. The method also includes, receiving, via a second IC pin, a test clock signal configured to control a latch function of each data storage element in the chain of data storage elements.