Systems and methods for depth map sampling
Abstract:
A method and electronic device for selectively obtaining depth information at locations within a scene are described. Image content analysis is performed on a received image of the scene. Locations within the image to obtain depth information within the scene are determined based on the image analysis. The locations are provided to a LIDAR (light+radar) unit to selectively obtain depth information at the scene locations. The depth information is received from the LIDAR unit and a second image analysis is performed on a second image. The second image analysis is based on the image content of the second image and the received depth information. Updated locations based on the second image analysis may be provided to the LIDAR unit to obtain updated depth information.
Public/Granted literature
Information query
Patent Agency Ranking
0/0