Invention Grant
- Patent Title: Systems and methods for depth map sampling
-
Application No.: US16359441Application Date: 2019-03-20
-
Publication No.: US11042723B2Publication Date: 2021-06-22
- Inventor: Albrecht Johannes Lindner , Volodimir Slobodyanyuk , Stephen Michael Verrall , Kalin Mitkov Atanassov
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Michael Kramer
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N13/261 ; G01S17/89 ; G01S7/497 ; G06T7/50 ; G01S17/86

Abstract:
A method and electronic device for selectively obtaining depth information at locations within a scene are described. Image content analysis is performed on a received image of the scene. Locations within the image to obtain depth information within the scene are determined based on the image analysis. The locations are provided to a LIDAR (light+radar) unit to selectively obtain depth information at the scene locations. The depth information is received from the LIDAR unit and a second image analysis is performed on a second image. The second image analysis is based on the image content of the second image and the received depth information. Updated locations based on the second image analysis may be provided to the LIDAR unit to obtain updated depth information.
Public/Granted literature
- US20190220650A1 SYSTEMS AND METHODS FOR DEPTH MAP SAMPLING Public/Granted day:2019-07-18
Information query