To enable inspection setting flows appropriate for a rule-based inspection mode and a learning-based inspection mode to be easily created when these modes are implemented in an image inspection apparatus. The rule-based inspection mode and the learning-based inspection mode are implemented in the image inspection apparatus. In the setting mode in a rule-based inspection, the user can set an imaging condition, select an image processing tool, set the application range of an image processing tool, and adjust the parameters of the image processing tool. In the setting mode in a learning-based inspection, a non-defective product image and a defective product image are input to generate a distinguishing device.