Invention Grant
- Patent Title: Substrate processing method
-
Application No.: US16881073Application Date: 2020-05-22
-
Publication No.: US11043389B2Publication Date: 2021-06-22
- Inventor: Kazuki Moyama , Kazuya Nagaseki
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JPJP2019-095705 20190522
- Main IPC: H01L21/3065
- IPC: H01L21/3065

Abstract:
A substrate processing method includes a first expanding step, a first gas supplying step, a first plasma processing step, and a first power stopping step. The first expanding step increases the volume of a gas diffusion chamber. The first gas supplying step supplies a first gas into the gas diffusion chamber. The first plasma processing step supplies radio-frequency power from a radio-frequency power supply to generate plasma in a processing chamber accommodating a substrate and reduces the volume of the gas diffusion chamber. The first power stopping step stops the supply of the radio-frequency power after the first plasma processing step.
Public/Granted literature
- US20200373166A1 SUBSTRATE PROCESSING METHOD Public/Granted day:2020-11-26
Information query
IPC分类: