- Patent Title: Light interference unit and light interference measurement device
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Application No.: US16706995Application Date: 2019-12-09
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Publication No.: US11054240B2Publication Date: 2021-07-06
- Inventor: Masato Takaya , Shinya Iwata
- Applicant: TATSUTA ELECTRIC WIRE & CABLE CO., LTD. , NIDEK CO., LTD.
- Applicant Address: JP Higashiosaka; JP Gamagori
- Assignee: TATSUTA ELECTRIC WIRE & CABLE CO., LTD.,NIDEK CO., LTD.
- Current Assignee: TATSUTA ELECTRIC WIRE & CABLE CO., LTD.,NIDEK CO., LTD.
- Current Assignee Address: JP Higashiosaka; JP Gamagori
- Agency: Oliff PLC
- Priority: JPJP2017-112500 20170607
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01B11/24 ; A61B3/10

Abstract:
A light interference unit includes a branching optical element, a multiplexing optical element, and at least one fiber device. The branching optical element branches a laser light with an emission wavelength temporally swept, into a measurement light and a reference light. The multiplexing optical element multiplexes the reference light and the measurement light reflected by a measured object, and causes them to interfere. The fiber device includes a reference light device. A transmission light path length is a light path length of the reference light transmitting the reference light device, from the reference light device to the multiplexing optical element. A reflection light path length is a light path length of the reference light reflected by a separation portion of the reference light device, from the reference light device to the multiplexing optical element. The transmission light path length is equal to or more than the reflection light path length.
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