Invention Grant
- Patent Title: Method and device for beam analysis
-
Application No.: US16694115Application Date: 2019-11-25
-
Publication No.: US11054305B2Publication Date: 2021-07-06
- Inventor: Matthias Manger , Christoph Husemann , Matus Kalisky , Lars Stoppe
- Applicant: Carl Zeiss SMT GmbH
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss SMT GmbH
- Current Assignee: Carl Zeiss SMT GmbH
- Current Assignee Address: DE Oberkochen
- Agency: Fish & Richardson P.C.
- Priority: DE102015219330.6 20151007
- Main IPC: B23K26/04
- IPC: B23K26/04 ; G01J1/42 ; G01J1/04 ; G02B27/10 ; B23K26/03 ; B23K26/70

Abstract:
A method and an apparatus for beam analysis in an optical system are disclosed, wherein a plurality of beam parameters of a beam propagating along an optical axis are ascertained. The method includes: splitting the beam into a plurality of partial beams which have a focus offset in the longitudinal direction in relation to the optical axis; recording a measurement image produced by these partial beams; carrying out a forward simulation of the beam in the optical system on the basis of estimated initial values for the beam parameters in order to obtain a simulated image; and calculating a set of values for the beam parameters on the basis of the comparison between the simulated image and the measurement image.
Public/Granted literature
- US20200088571A1 METHOD AND DEVICE FOR BEAM ANALYSIS Public/Granted day:2020-03-19
Information query
IPC分类: