Invention Grant
- Patent Title: Microscopic analysis device
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Application No.: US16074906Application Date: 2016-09-20
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Publication No.: US11054365B2Publication Date: 2021-07-06
- Inventor: Shuhei Okuyama
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Priority: JPJP2016-032232 20160223
- International Application: PCT/JP2016/077673 WO 20160920
- International Announcement: WO2017/145422 WO 20170831
- Main IPC: G02B17/06
- IPC: G02B17/06 ; G01N21/27 ; G02B17/08 ; G02B21/00 ; G02B21/04

Abstract:
A microscopic analysis apparatus including a concentrating optical system 5 that concentrates measurement light emitted from a sample in a measuring area on a first concentration point, an aperture plate having an opening located at the first concentration point, an elliptical concave mirror 8 that reflects measurement light passing through the opening and concentrates the reflected measurement light on a second concentration point, a shielding plate disposed in front of the second concentration point, a through-hole having an end surface, whose shape coincides with a shape of a cross section of a light flux of measurement light at the position, being formed in the shielding plate, and a photodetector provided at the second concentration point. In this way, it is possible to allow more measurement light to enter the photodetector without allowing light outside the measuring area to enter the photodetector.
Public/Granted literature
- US20190033207A1 MICROSCOPIC ANALYSIS DEVICE Public/Granted day:2019-01-31
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