Invention Grant
- Patent Title: Apparatus and method for cleaning reticle stage
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Application No.: US16902087Application Date: 2020-06-15
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Publication No.: US11054756B2Publication Date: 2021-07-06
- Inventor: Yu-Fu Lin , Tung-Jung Chang , Chia-Chen Chen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McDermott Will & Emery LLP
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03F7/20 ; B08B3/12 ; B08B7/02

Abstract:
An apparatus for cleaning an electrostatic reticle holder used in a lithography system includes a chamber for providing a low pressure environment for the electrostatic reticle holder and an ultrasound transducer configured to apply ultrasound waves to the electrostatic reticle holder. The apparatus further includes a controller configured to control the ultrasound transducer and a gas flow controller. The gas flow controller is configured to enable pressurizing or depressurizing the chamber.
Public/Granted literature
- US20200310258A1 APPARATUS AND METHOD FOR CLEANING RETICLE STAGE Public/Granted day:2020-10-01
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