- Patent Title: Testing SoC with portable scenario models and at different levels
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Application No.: US16553083Application Date: 2019-08-27
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Publication No.: US11055212B2Publication Date: 2021-07-06
- Inventor: Adnan Hamid , Kairong Qian , Kieu Do , Joerg Grosse
- Applicant: Breker Verification Systems
- Applicant Address: US CA San Jose
- Assignee: Breker Verification Systems
- Current Assignee: Breker Verification Systems
- Current Assignee Address: US CA San Jose
- Agency: Penilla IP, APC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/36 ; G01R31/3177 ; G01R31/3181 ; G06F30/20 ; G06F30/39 ; G06F30/331 ; G06F3/0484 ; G06F11/22 ; G06F11/263 ; G06T11/20 ; G06F9/48 ; G06F11/25

Abstract:
A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
Public/Granted literature
- US20190391204A1 TESTING SOC WITH PORTABLE SCENARIO MODELS AND AT DIFFERENT LEVELS Public/Granted day:2019-12-26
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