Invention Grant
- Patent Title: Method and apparatus for analyzing an image
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Application No.: US16615568Application Date: 2018-06-04
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Publication No.: US11055580B2Publication Date: 2021-07-06
- Inventor: Peter Amon , Andreas Hutter , Sanjukta Ghosh
- Applicant: SIEMENS AKTIENGESELLSCHAFT
- Applicant Address: DE Munich
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE Munich
- Agency: Lempia Summerfield Katz LLC
- Priority: IN201711019646 20170605
- International Application: PCT/EP2018/064631 WO 20180604
- International Announcement: WO2018/224442 WO 20181213
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/194 ; G06T7/143 ; G06K9/00

Abstract:
The disclosure relates to a method and an apparatus for analyzing an image using a deep neural net pre-trained for multiple classes. The image is processed by a forward pass through an adapted neural net to generate a processing result. The adapted neural net is adapted from the pre-trained neural net to focus on exactly one selected class. The processing result is then analyzed focused on features corresponding to the selected class using an image processing algorithm. A modified image is generated by removing a manifestation of these features from the image.
Public/Granted literature
- US20210089816A1 METHOD AND APPARATUS FOR ANALYZING AN IMAGE Public/Granted day:2021-03-25
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