Invention Grant
- Patent Title: Nonvolatile memory device and method of controlling initialization of the same
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Application No.: US17012135Application Date: 2020-09-04
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Publication No.: US11056200B2Publication Date: 2021-07-06
- Inventor: Jiyeon Shin , Sangwan Nam , Sangwon Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2019-0092925 20190731
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C16/34 ; H01L27/11526 ; H01L27/11573 ; H01L27/1157 ; G11C16/26 ; H01L27/11524 ; H01L27/11556 ; G11C16/10 ; H01L27/11582

Abstract:
Method of controlling initialization of nonvolatile memory device, where nonvolatile memory device includes memory cell region including first metal pad and peripheral circuit region including second metal pad and vertically connected to memory cell region by first and second metal pads, includes performing first sensing operation to sense write setting data stored in first memory cells in memory cell region of first memory plane and store first read setting data in first page buffer circuit in peripheral circuit region of first memory plane, performing second sensing operation to sense write setting data stored in second memory cells in memory cell region of second memory plane and store second read setting data in second page buffer circuit in peripheral circuit region of second memory plane and performing dump-down operation to store restored setting data in buffer based on first read setting data and second read setting data.
Public/Granted literature
- US20210035650A1 NONVOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING INITIALIZATION OF THE SAME Public/Granted day:2021-02-04
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