Invention Grant
- Patent Title: Ratiometric gain error calibration schemes for delta-sigma ADCs with programmable gain amplifier input stages
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Application No.: US16879941Application Date: 2020-05-21
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Publication No.: US11057048B2Publication Date: 2021-07-06
- Inventor: Vincent Quiquempoix
- Applicant: Microchip Technology Incorporated
- Applicant Address: US AZ Chandler
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Current Assignee Address: US AZ Chandler
- Agency: Slayden Grubert Beard PLLC
- Main IPC: H03M3/00
- IPC: H03M3/00 ; H03M1/12

Abstract:
An analog to digital converter (ADC) includes voltage and reference input terminals, a buffer circuit, and control logic. The buffer circuit includes input and output terminals and a variable resistor including resistive branches connected in parallel. The control logic is configured to, in a calibration phase, determine a given gain value for which gain error is to be calibrated, determine a set of the resistive branches in the buffer circuit to be used to achieve the given gain value, successively enable a different resistive branch of the variable resistor of the set until all resistive branches of the set have been enabled, determine an output code resulting after enabling all resistive branches of the set, and, from the output code, determine a gain error of the given gain value. The control logic is further configured to take corrective action based upon the gain error of the given gain value.
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