Invention Grant
- Patent Title: Method and system for testing antenna array using middle field antenna pattern
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Application No.: US16367642Application Date: 2019-03-28
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Publication No.: US11057119B2Publication Date: 2021-07-06
- Inventor: Ya Jing , Hong-Wei Kong , Zhu Wen
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: G01R29/10
- IPC: G01R29/10 ; H04B17/10 ; H04B17/12

Abstract:
A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.
Public/Granted literature
- US20200028598A1 METHOD AND SYSTEM FOR TESTING ANTENNA ARRAY USING MIDDLE FIELD ANTENNA PATTERN Public/Granted day:2020-01-23
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