Invention Grant
- Patent Title: System and process for roof measurement using imagery
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Application No.: US16871596Application Date: 2020-05-11
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Publication No.: US11060857B2Publication Date: 2021-07-13
- Inventor: Dale R. Thornberry , Chris T. Thornberry , Mark F. Garringer
- Applicant: Pictometry International Corp.
- Applicant Address: US NY Rochester
- Assignee: Pictometry International Corp.
- Current Assignee: Pictometry International Corp.
- Current Assignee Address: US NY Rochester
- Agency: Dunlap Codding, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/28 ; G06T7/62 ; G06F30/13 ; G06F3/0481

Abstract:
The present disclosure describes systems and processes, including processes in which first location data is received. Visual access to a first image corresponding to the first location data is provided, the first image including a roof structure of a building. A first computer input capable of signaling a designation from the user of a building roof structure location within the first image is provided. A designation of the building roof structure location within the first image is received. Responsive to receiving the designation of the building roof structure location, a second computer input capable of signaling user-acceptance of the building roof structure location within the first image is provided. Subsequent to receiving the user-acceptance confirming the designation of the building roof structure location, a report of the roof structure is provided.
Information query