Invention Grant
- Patent Title: Probe including an alignment key protruded from a side of an alignment beam and a probe card including the same
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Application No.: US16368493Application Date: 2019-03-28
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Publication No.: US11061052B2Publication Date: 2021-07-13
- Inventor: Sung-Hoon Lee , Byoung-Joo Kim , Mi-Rye Lee , Hwang-Jin Yeo , Tae-Jong Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2018-0108211 20180911
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/26 ; G01R1/073
Abstract:
A probe includes a probe body for providing an object with a test signal; a tip arranged on an end of the probe body to make contact with the object; and an alignment key protruded from a side of the probe body.
Public/Granted literature
- US20200081035A1 PROBE AND A PROBE CARD INCLUDING THE SAME Public/Granted day:2020-03-12
Information query
