Invention Grant
- Patent Title: Guide plate for probe card and manufacturing method thereof, and probe card having same
-
Application No.: US16666132Application Date: 2019-10-28
-
Publication No.: US11061070B2Publication Date: 2021-07-13
- Inventor: Bum Mo Ahn , Seung Ho Park , Sung Hyun Byun
- Applicant: POINT ENGINEERING CO., LTD.
- Applicant Address: KR Asan
- Assignee: POINT ENGINEERING CO., LTD.
- Current Assignee: POINT ENGINEERING CO., LTD.
- Current Assignee Address: KR Asan
- Priority: KR10-2018-0130178 20181029
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R3/00 ; G01R1/073

Abstract:
Disclosed is a guide plate for a probe card guiding a probe pin of the probe card and a manufacturing method thereof, and the probe card having the same. Particularly, the guide plate and a manufacturing method thereof, and the probe card securing reliability of the probe card are intended to be provided, wherein probe pins are easily inserted into the guide plate, and pin insertion holes into which the probe pins are inserted are precisely formed in a small size.
Information query