Invention Grant
- Patent Title: Error detection circuit
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Application No.: US16396941Application Date: 2019-04-29
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Publication No.: US11061783B2Publication Date: 2021-07-13
- Inventor: Saya Goud Langadi , Srinivasa Chakravarthy Bs
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Brian D. Graham; Charles A. Brill; Frank D. Cimino
- Main IPC: G06F11/16
- IPC: G06F11/16 ; G06F11/10

Abstract:
A circuit and method for verifying the operation of error checking circuitry. In one example, a circuit includes a memory, a first error checking circuit, a second error checking circuit, and a comparison circuit. The memory includes a data output. The first error checking circuit includes an input and an output. The input of the first error checking circuit is coupled to the data output of the memory. The second error checking circuit includes an input and an output. The input of the second error checking circuit is coupled to the data output of the memory. The comparison circuit includes a first input and a second input. The first input is coupled to the output of the first error checking circuit. The second input is coupled to the output of the second error checking circuit.
Public/Granted literature
- US20200341869A1 ERROR DETECTION CIRCUIT Public/Granted day:2020-10-29
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