Invention Grant
- Patent Title: Concentricity measurement platform
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Application No.: US16701632Application Date: 2019-12-03
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Publication No.: US11067383B2Publication Date: 2021-07-20
- Inventor: Hongtao Liu , Dandan Zhang , Roberto Francisco-Yi Lu , Lei Zhou
- Applicant: Tyco Electronics (Shanghai) Co. Ltd. , TE Connectivity Corporation
- Applicant Address: CN Shanghai; US PA Berwyn
- Assignee: Tyco Electronics (Shanghai) Co. Ltd.,TE Connectivity Corporation
- Current Assignee: Tyco Electronics (Shanghai) Co. Ltd.,TE Connectivity Corporation
- Current Assignee Address: CN Shanghai; US PA Berwyn
- Agency: Barley Snyder
- Priority: CN201822012649.1 20181203
- Main IPC: G01B11/08
- IPC: G01B11/08 ; G06T7/50 ; G01B11/06
Abstract:
A concentricity measurement platform includes a vision system capturing an image of an annular member to be measured and a computer system communicatively coupled to the vision system. The computer system calculates a concentricity of the annular member based on the image captured by the vision system.
Public/Granted literature
- US20200173768A1 Concentricity Measurement Platform Public/Granted day:2020-06-04
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