Invention Grant
- Patent Title: Correction of curved projection of a spectrometer slit line
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Application No.: US16480207Application Date: 2018-02-07
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Publication No.: US11067441B2Publication Date: 2021-07-20
- Inventor: Huibert Visser , Hedser van Brug
- Applicant: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Applicant Address: NL 's-Gravenhage
- Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Current Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Current Assignee Address: NL 's-Gravenhage
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: EP17155240 20170208,EP17170616 20170511
- International Application: PCT/NL2018/050084 WO 20180207
- International Announcement: WO2018/147731 WO 20180816
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G02B17/08

Abstract:
Correction optics (10) are disposed in an optical path directly behind an entry slit (1) of a spectrometer (100) and configured to warp a straight object line shape (A1) of the entry slit (1) into a curved object line shape (B1) from a point of view of the projection optics (2,3,4). The warping of the correction optics (10) is configured such that a curvature (R1) of the curved object line shape (B1) counteracts an otherwise distorting curvature (R5) in a projection (A5) of the straight object line shape (A1) by the projection optics (2,3,4) without the correction optics (10). As a result, the spectrally resolved image (B5) comprises a plurality of parallel straight projected line shapes formed by spectrally resolved projections of the straight object line shape (A1).
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